Electron tomographic characterization of ErSi2 and Ge xSi1-x nanoparticles prepared by doping of 4H-SiC

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1546-1547

  Kübel, Christian ^a   Kaiser, Ute ^b  

^a FRAUNHOFER INSTITUTE FOR MANUFACTURING TECHNOLOGY AND ADVANCED MATERIALS IFAM   (Germany)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750874297     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606064932     Document Type: Conference Paper

References (4)

1. F. Bechstedt, A. Fissel, J. Furthmüller, U. Kaiser, H.-Ch. Weissker, W. Wesch, Appl. Surf. Science 212 (2003) 820.
2. U. Kaiser, D.A. Muller, A. Chuvilin, G. Pasold, W. Witthuhn, Micr. and Microanal. 9 (2003) 1.
3. U. Kaiser, J. Biskupek, D. Muller, K. Gärtner, Ch. Schubert, Cryst. Res. Techn. 37 (2002) 391.
4. U. Kaiser, D.A. Muller, J.L. Grazul, A. Chuvilin, M. Kawasaki, Nature Materials 1 (2002) 102.