Multi-technique, multivariate analysis methods for enhanced sample characterization

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1402-1403

  Artyushkova, K ^a   Pylypenko, S ^a   Fenton, J ^a   Archuleta, K ^a   Williams, L ^a   Fulghum, J ^a  

^a University of New Mexico   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750874036     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606069492     Document Type: Conference Paper

References (3)

1. K. Artyushkova et al., XPS Imaging. IM Publications: UK (2003) 677.
2. K. Artyushkova et al., J. Surf. Anal. 9 (2002) 332.
3. This work is partially supported by NSF DMR-0354157, NSF CHE-9613880, NSF CORE IGERT and UNM Keck Nanofluidics Laboratory. The XPS was funded by a grant from the Keck Foundation and NSF CHE-011374.