CCD operation using the high speed imager test station

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1801, Issue , 1993, Pages 446-453

  Albright, Kevin L ^a   Yates, George J ^a   King, Nicholas S P ^a   McDonald, Thomas E ^a   Turko, Bojan T ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLOCKS;

HIGH SPEED; MULTIPLE OUTPUTS; PATTERN GENERATOR; TEST STATION;

HIGH SPEED PHOTOGRAPHY;

EID: 33750870786     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.145796     Document Type: Conference Paper

References (2)

1. George J. Yates, Kevin L. Albright, and Bojan T. Turko, "High-speed test station for solid-state imagers", SPIE's 1992 International Symposium on Optical Applied Science and Engineering, July 19-24, 1992, San Diego, California, U. S. A.
2. Tektronix Application Note, DAS9200 Logic Analyzer, 92S16/92S32 copyright 1989.