The photon detector and the variable-pressure scanning electron microscope: An alternative method for cathodoluminescence imaging of geologic materials

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1530-1531

  Williams, T J ^a   Bailey, J F ^a  

^a UNIVERSITY OF IDAHO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750869486     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606064348     Document Type: Conference Paper

References (2)

1. J.I. Goldstein et al., Scanning Electron Microscopy and X-ray Microanalysis, Plenum, New York, 2003.
2. The Murdock Charitable Trust provided support for the Field-Emission VP SEM Laboratory. The assistance of Dr. William McClelland is gratefully acknowledged.