The new laser assisted wide angle tomographic atom probe

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1726-1727

  Renaud, L ^a   Monsallut, P ^a   Benard, Ph ^a   Saliot, Ph ^a   Da Costa, G ^b   Vurpillot, F ^b   Deconihout, B ^b  

^a CAMECA   (United States)

^b UNIVERSITÉ DE ROUEN   (France)

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EID: 33750868983     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606063410     Document Type: Conference Paper

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