Characterization of sputtered Ge-Sn thin films by high resolution methods

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 712-713

  Calderon H A ^a   Vidal, M A ^b   De Guevara, Héctor Ladrón ^b  

^a INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^b INSTITUTO DE INVESTIGACIÓN EN COMUNICACIÓN ÓPTICA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750867999     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606064324     Document Type: Conference Paper

References (2)

1. H. Pérez Ladrón de Guevara, A. G. Rodriguez, H. Navarro-Contreras and M. A. Vidal, , Appl. Phys. Letts. Vol. 83, 4942 (2003).
2. HAC acknowledges support from CONACYT (Proy. 45887), IPN (COFAA and SIP) and LBNL-NCEM for the use of microscopes. MAV acknowledges CONACYT and UASLP.