Determination of the backscattered yield coefficient by Monte Carlo calculations and comparison with experimental measurements

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 854-855

  Demers, Hendrix ^a,b   Gauvin, Raynald ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750865705     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606067961     Document Type: Conference Paper

References (5)

1. D. Joy electron solid interaction database: http://web.utk.edu/~srcutk/ htm/interact.htm
2. PENELOPE: http://www.nea.fr/abs/html/nea-1525.html
3. CASINO: http://www.gel.usherbrooke.ca/casino/
4. NISTMonte: http://www.duck-and-cover.com/
5. Win X-ray: http://www.montecarlomodeling.mcgill.ca/