Electronic properties of complex oxide interfaces

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1140-1141

  Varela, M ^a   Christen, H M ^a   Lee, H N ^a   Pennycook, S J ^a   Pena V ^b   Sefrioui, Z ^b   Santamaria, J ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750856826     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606063641     Document Type: Conference Paper

References (6)

1. A. Ohtomo and H. Y. Hwang, Nature 427, (2004) 423
2. S. Okamoto and A. J. Millis, Nature 428, (2004) 630
3. M. Varela et al., Phys. Rev. Lett. 92, (2004) 095502
4. Z. Sefrioui et al., Appl. Phys. Lett. 81, (2002) 4568
5. N. Browning et al., Physica C 202, (1992) 12
6. This work was supported by DOE BES Division of Materials Sciences under contract DE-AC05-00OR22725 managed by UT-Battelle, LLC.