Experimental determination of the band offset of rare earth oxides on various semiconductors

Topics in Applied Physics

Volumn 106, Issue , 2006, Pages 269-283

  Seguini, Gabriele ^a   Perego, Michele ^a   Fanciulli, Marco ^a  

^a LABORATORIO MDM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750834621     PISSN: 03034216     EISSN: 14370859     Source Type: Book Series    
DOI: 10.1007/11499893_16     Document Type: Article

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