Non-contact dynamic mode atomic force microscope: Effects of nonlinear atomic forces

NanoSingapore 2006: IEEE Conference on Emerging Technologies - Nanoelectronics - Proceedings

Volumn 2006, Issue , 2006, Pages 458-462

  Das, Soma ^a   Sreeram, P A ^a   Raychaudhuri, Arup K ^a,b   Sai, T Phanindra ^b   Brar, Loveleen K ^b  

^a S N BOSE NATIONAL CENTRE FOR BASIC SCIENCES   (India)

^b INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CIRCUIT OSCILLATIONS; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; VIBRATION MEASUREMENT;

CANTILEVER TIPS; DYNAMIC FORCE MICROSCOPY (DFM); RESONANCE CURVES; VIBRATING MICROCANTILEVERS;

ELECTRONIC EQUIPMENT;

EID: 33750829189     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NANOEL.2006.1609771     Document Type: Conference Paper

References (5)

1. G. Binning, C. F. Quate and Ch. Gerber, "Atomic Force Microscope," Physical Review Letters, vol. 56, pp 930 - 933 March 1986.
2. Robert W. Stark,* Georg Schitter, and Andreas Stemmer, "Tunig the interaction forces in tapping mode atomic force microscopy," Physical Review B, vol. 68, pp 085401-1-085401-5, August 2003.
3. S. I. Lee, S. W. Howell, A. Raman, and R. Reifenberger, "Nonlinear dynamics of microcantilevers in tapping mode atomic force microscopy: A comparison between theory and experiment," Physical Review B, vol. 66, pp 115409-1 - 115409-9, September 2002.
4. Ricardo Garcia and Alvaro San Paulo, "Dynamics of a vibrating tip near or in intermittent contact with a surface," Physical Review B, vol. 61, pp R 13381-R 13384, May 2000.
5. B. Anczykowski, D. Kruger, H. Fuchs, "Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects." Physical Review B, vol. 53, pp 15485-15488, June 1996.