Temperature effect (300-1500 K) on the infrared photon transport inside an X-ray microtomographic reconstructed porous silica glass

Journal of Quantitative Spectroscopy and Radiative Transfer

Volumn 104, Issue 2, 2007, Pages 257-265

  Rousseau, Benoit ^a   Di Michiel, Marco ^b   Canizares, Aurélien ^a   De Sousa Meneses, Domingos ^a,c   Echegut, Patrick ^a   François Thovert, Jean ^d  

^a Centre National de la Recherche Scientifique   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c Polytech'Orléans ^*  (France)

^d CNRS LCD   (France)

Author keywords

Infrared spectroscopy; Porosity; Ray tracing; Silica glass

Indexed keywords

COMPUTER SIMULATION; EMISSION SPECTROSCOPY; FUSED SILICA; INFRARED RADIATION; MATHEMATICAL MODELS; MONTE CARLO METHODS; RAY TRACING; THERMAL EFFECTS;

COMPLEX OPTICAL INDEX; INFRARED PHOTON TRANSPORT; SPECTRAL EMITTANCE;

INFRARED SPECTROSCOPY;

INFRARED SPECTROSCOPY; POROSITY; SILICA; TEMPERATURE EFFECT; X-RAY;

EID: 33750801615     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jqsrt.2006.07.015     Document Type: Article

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