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Volumn 253, Issue 3, 2006, Pages 1265-1268
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Characterization of conductance under finite bias for a self-assembled monolayer coated Au quantized point contact
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Author keywords
Cross wire junction; I V behavior; Quantum conductance
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CONDUCTANCE;
FINITE ELEMENT METHOD;
GOLD;
POINT CONTACTS;
PROTECTIVE COATINGS;
CROSS WIRE JUNCTION;
FINITE BIAS;
QUANTUM CONDUCTANCE;
SELF ASSEMBLY;
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EID: 33750702147
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2006.01.070 Document Type: Article |
Times cited : (5)
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References (18)
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