Parameter estimate with only one complete failure observation using Monte Carlo EM algorithm

International Journal of Reliability, Quality and Safety Engineering

Volumn 8, Issue 2, 2001, Pages 109-122

  Pang, Wan Kai ^a   Leung, Ping Kei ^a   Xiao Long, P U ^b   Shi Song, Mao ^b  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

EM algorithm; Failure data; Likelihood function; MCEM algorithm; Weibull distribution

Indexed keywords

EID: 33750691153     PISSN: 02185393     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218539301000402     Document Type: Article

References (6)

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3. S. S. Mao and J. Chen, "Bayesian analysis of data with only one failure". Applied Mathematics, Journal of Chinese University 11 (B) (1996), pp. 434-444.
4. W. Nelson, Accelerated Testing (John Wiley & Sons, New York, 1990).
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