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Revue Generale de Thermique
Volumn 35, Issue 413, 1996, Pages 338-343
Cryogenic temperature measurement
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Indexed keywords

EID: 33750657735     PISSN: 00353159     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0035-3159(99)80076-2     Document Type: Article
Times cited : (6)
References (12)
  • 1
    • 0025448992 scopus 로고
    • A matter of degrees: A brief history of cryogenics
    • RG Scurlock (1990) A matter of degrees : a brief history of cryogenics. Cryogenics 30, 6, 483-500
    • (1990) Cryogenics , vol.30 , pp. 6
    • Scurlock, R.G.1
  • 4
    • 0025386905 scopus 로고
    • The International Temperature Scale of 1990 (ITS-90)
    • see also the article by C Bonnier in this issue
    • H Preston-Thomas (1990) The International Temperature Scale of 1990 (ITS-90). Metrologia 27, 1, 3-10 and 107 (see also the article by C Bonnier in this issue)
    • (1990) Metrologia , vol.27 , pp. 1
    • Preston-Thomas, H.1
  • 5
    • 0006002135 scopus 로고
    • The rhodium-iron resistance thermometer: Ten years on
    • ed JF Schooley, American Institute of Physics, New York
    • RL Rusby (1982) The rhodium-iron resistance thermometer : ten years on. Temperature : its measurement and control in science and industry 5, 829-833, ed JF Schooley, American Institute of Physics, New York
    • (1982) Temperature: Its Measurement and Control in Science and Industry , vol.5 , pp. 829-833
    • Rusby, R.L.1
  • 7
    • 0021497602 scopus 로고
    • Use of ceramic-encapsulated rhodium-iron alloy resistance thermometers below 80 K: Thermometric properties and stability
    • LM Besley (1984) Use of ceramic-encapsulated rhodium-iron alloy resistance thermometers below 80 K : thermometric properties and stability. J Phys E : Scientific Instruments 17, 778-781
    • (1984) J Phys E: Scientific Instruments , vol.17 , pp. 778-781
    • Besley, L.M.1
  • 8
    • 0025465666 scopus 로고
    • Temperature and magnetic field dependence of resistance in Zr-N sputtered films
    • Proceedings of the 19th International conference on low temperature physics
    • M Yoshizawa, K Ikeda, T Yotsuya, T Müller, P Wyder (1990) Temperature and magnetic field dependence of resistance in Zr-N sputtered films. Proceedings of the 19th International conference on low temperature physics, Physica B 165 & 166, 293-294
    • (1990) Physica B , vol.165-166 , pp. 293-294
    • Yoshizawa, M.1    Ikeda, K.2    Yotsuya, T.3    Müller, T.4    Wyder, P.5
  • 9
    • 0038984948 scopus 로고
    • 2 based thick film resistors as high sensitivity thermometers for millikelvin temperatures
    • 2 based thick film resistors as high sensitivity thermometers for millikelvin temperatures. Cryogenics 32, 1167
    • (1992) Cryogenics , vol.32 , pp. 1167
    • Batko, I.1    Somora, M.2    Vanicky, D.3    Flachbart, K.4
  • 10
    • 0029275810 scopus 로고
    • Silicon diode temperature sensors for process systems
    • PC MacDonald (1995) Silicon diode temperature sensors for process systems. Cryogenics 35, 199-201
    • (1995) Cryogenics , vol.35 , pp. 199-201
    • MacDonald, P.C.1
  • 11
    • 0028693877 scopus 로고
    • Low temperature glass capacitance sensors
    • Proceedings of the 15th International cryogenic engineering conference
    • P Stehlow (1994) Low temperature glass capacitance sensors. Proceedings of the 15th International cryogenic engineering conference, Cryogenics 34, 421-424
    • (1994) Cryogenics , vol.34 , pp. 421-424
    • Stehlow, P.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.