Code-coverage guided prioritized test generation

Information and Software Technology

Volumn 48, Issue 12, 2006, Pages 1187-1198

  Li, J Jenny ^a   Weiss, David ^a   Yee, Howell ^b  

^a AVAYA LABS RESEARCH   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Code coverage; Constraint solver; Test generation

Indexed keywords

ALGORITHMS; COMPUTER PROGRAMMING; CONSTRAINT THEORY; PROBLEM SOLVING; SOFTWARE ENGINEERING;

CODE COVERAGE; CONSTRAINT SOLVERS; TEST GENERATION;

CODES (SYMBOLS);

EID: 33750617644     PISSN: 09505849     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infsof.2006.06.007     Document Type: Article

References (22)

1. Agrawal H., Li J.J., Wong W.E., et al. Mining system tests to aid software maintenance. IEEE Comput. 31 7 (1998) 64-73
2. J. Jenny Li, Prioritize code for testing to improve code coverage of complex software, in: Proceedings of the International Symposium on Software Reliability Engineering (ISSRE), October 2005, Chicago, IL.
3. Sami Beydeda, Volker Gruhn, BINTEST - Binary search-based test case generation. Computer Software and Applications Conference (COMPSAC03), 03.11.2003-06.11.2003, Dallas, USA.
4. L. Bromstrup, D. Hogrefe, TESDL: experience with generating test cases from SDL specifications, Proceedings of the Fourth SDL Forum, Elsevier, Amsterdam, 1989, pp. 267-279.
5. J. Offutt, A. Abdurazik, Generating tests from UML specifications, Proceedings of International Conference on the Unified Modeling Language, October 1999, Fort Collins, CO, pp. 416-429.
6. J. Hartmann, C. Imoberdorf, M. Meisinger, uml-based integration testing, Proceedings of ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA), August 2000, Portland, Oregon, USA,, pp. 60-70.
7. W.T. Tsai, R. Paul, Z. Cao, B. Xiao, L. Yu, Adaptive scenario-based testing using UML, in: OMG's Third Workshop on UML for Enterprise Applications: Model Driven Solutions for the Enterprise, October 2002, San Francisco, CA, USA.
8. J.J. Li, W.E. Wong, Automatic test generation from communicating extended finite state machine (cefsm)-based models, Proceedings of the Fifth IEEE International Symposium on Object-Oriented Real-Time Distributed Computing (ISORC), April 29-May 1, 2002, Washington, D.C.
9. A. Petrenko, N. Yevtushenko, R. Dssouli, Testing strategies for communicating FSMs, Proceedings of the Seventh International Workshop on Protocol Test Systems (IWPTS), November 1994, Tokyo, Japan, pp. 193-208.
10. Cohen D.M., Dalal S.R., Fredman M.L., and Patton G.C. The ATEG system: an approach to testing based on combinatorial sesign. IEEE Transactions on Software Engineering 23 27 (1997) 437-444
11. T.H. Cormen, C.E. Leiserson, R.L. Rivest, C. Stein, Introduction to Algorithms, second ed., The MIT Press, USA.
12. J. Edvardson, A survey on automatic test data generation, Proceedings of Second Conference on Computer Science and Engineering, October 1999, Linköping, Sweden, pp. 21-28.
13. Korel B. Automated software test data generation. IEEE Transactions on Software Engineering 16 8 (1990) 870-879
14. N. Gupta, A.P. Mathur, M.L. Soffa, Generating test data for branch coverage, in: Proceedings of Automated Software Engineering, 2000, pp. 219-222.
15. Ramamoorthy C., Ho S., and Chen W. On the automated generation of program test data. IEEE Transactions on Software Engineering SE-2 4 (1976) 293-300
16. Clarke L. A system to generate test data and symbolically execute programs. IEEE Transactions Software Engineering 2 3 (1976) 215-222
17. Howden W. Symbolic testing and the DISSECT symbolic evaluation system. IEEE Transactions on Software Engineering 4 4 (1977) 266-278
18. A. Mayrhauser, M. Scheetz, E. Dahlman, Generating goal-oriented test cases, in: Proceedings of the 23rd Annual International Computer Software and Applications Conference (COMPSAC), October 1999, Phoenix, Arizona, USA, pp. 110-115.
19. C.C. Micheal, G. McGraw, Automated software test data generation for complex programs, in: Proceedings of 13th IEEE International Conference on Automated Software Engineering, October 1998, Honolulu, Hawaii, USA, pp. 136-146.
20. C.C. Micheal, G.E. McGraw, M.A. Schatz, C.C. Walton, Genetic algorithms for dynamic test data generation, in: Proceedings of the 12th IEEE International Conference, November 1997, Tahoe, Nevada, pp. 307-308.
21. N.T. Sy and Y. Deville, Automatic test data generation for programs with integer and float variables, in: Proceedings of the 16th IEEE Annual International Conference on Automated Software Engineering (ASE), November 2001, San Diego, California, pp. 13-21.
22. Z. Zeng, M. Ciesielski, B. Rouzeyre, Functional test generation using constraint logic programming, in: Proceedings of International conference on Very Large Scale Integration (VLSI-SOC), December 2001, Montepellier, Le Corum, France, pp. 375-387.