Size effect relating to the extraordinary and the ordinary Hall effect in ultrathin Fe-Pt films

Russian Microelectronics

Volumn 35, Issue 6, 2006, Pages 392-397

  Matveev, V N ^a   Levashov, V I ^a   Kononenko, O V ^a   Chaika, A N ^b  

^a INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; HALL EFFECT; LASER ABLATION; METALLIC FILMS; PLATINUM; SIZE DETERMINATION; THICKNESS MEASUREMENT; VACUUM APPLICATIONS;

FILM RESISTIVITY; HALL COEFFICIENTS;

IRON;

EID: 33750572228     PISSN: 10637397     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063739706060072     Document Type: Article

References (3)

1. Gerber, A., Milner, A., Karpovsky, M., Lemke, B., Habermeier, H.-U., Tuaillon-Combes, J., Négrier, M., Boisron, O., Mélinon, P., and Perez, A., J. Magn. Magn. Mater., 2002, vols. 242-245, part 1, pp. 90-97.
2. Matveev, V.N., Berezin, V.A., Volkov, V.T., Firsov, A.A., Kononenko, O.V., and Levashov, V.I., Int. J. Nanosci., 2004, vol. 3, nos. 1-2, pp. 149-154.
3. Altieri, S., Tjeng, L.H., and Sawatzky, G.A., Thin Solid Films, 2001, vol. 400, nos. 1-2, pp. 9-15.