Millimeter-wave backscatter diagnostic for the study of short scale length plasma fluctuations (invited)

Review of Scientific Instruments

Volumn 77, Issue 10, 2006, Pages

  Rhodes, T L ^c   Peebles, W A ^c   Nguyen, X ^c   Vanzeeland, M A ^a   Degrassie, J S ^b   Doyle, E J ^c   Wang, G ^c   Zeng, L ^c  

^a OAK RIDGE INSTITUTE FOR SCIENCE AND EDUCATION   (United States)

^b GENERAL ATOMICS   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

FAR INFRARED FORWARD SCATTERING SYSTEMS; LABORATORY TEST; SPECTRAL RANGE; WAVELENGTH;

BACKSCATTERING; ELECTRON CYCLOTRON RESONANCE; INFRARED RADIATION; LIGHT; MILLIMETER WAVES; OPTICAL SYSTEMS; SPECTRUM ANALYSIS; TURBULENCE;

PLASMA DIAGNOSTICS;

EID: 33750518216     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2235874     Document Type: Conference Paper

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