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Volumn 600, Issue 21, 2006, Pages 4896-4908

Determination of the nanoscale dielectric properties in ferroelectric lead zirconate titanate (PZT) thin films

Author keywords

Atomic force microscopy; Dielectric polarization; Ferroelectricity; Thin dielectric films

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; NANOSTRUCTURED MATERIALS; PERMITTIVITY; POLARIZATION; VOLTAGE CONTROL;

EID: 33750484288     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.08.011     Document Type: Article
Times cited : (2)

References (37)
  • 28
    • 0008366515 scopus 로고    scopus 로고
    • Surface forces and adhesion
    • Bhushan B. (Ed), CRC Press, Boca Raton, FL
    • Burnham N., and Kulik A.J. Surface forces and adhesion. In: Bhushan B. (Ed). Handbook of Micro/Nanotribology (1999), CRC Press, Boca Raton, FL
    • (1999) Handbook of Micro/Nanotribology
    • Burnham, N.1    Kulik, A.J.2
  • 33
    • 33750487412 scopus 로고    scopus 로고
    • M. Abplanalp, P. Günter, Proc. Int. Symp. Appl. Ferroelectrics, ISAF XI'98, Montreux, Switzerland, 1998.
  • 36
    • 33750492879 scopus 로고    scopus 로고
    • T. Otto, Diploma Thesis, TU Dresden, 2001.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.