Calculation of film thickness for dip coated antireflective films

Thin Solid Films

Volumn 515, Issue 3, 2006, Pages 907-910

  Crawford, L J ^a   Edmonds, N R ^a  

^a UNIVERSITY OF AUCKLAND   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; OPTICAL COATINGS; REFRACTIVE INDEX; THERMAL EFFECTS;

DIP COATING METHOD; FILM THICKNESS; QUARTER WAVELENGTH OPTICAL THICKNESS (QWOT);

OPTICAL FILMS;

EID: 33750458703     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.07.058     Document Type: Article

References (7)

1. Yang C.-C., Josefowicz J.Y., and Alexandru L. Thin Solid Films 74 1 (1980) 117
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3. B.V. Deryagin, S.M. Levi, Film Coating Theory (W.R. Eichler and E.A. Sutherns, Trans.). London: The Focal Library. (1964).
4. Landau L., and Levich B. Acta Phys. Chim. USSR 17 (1942) 43
5. Blok H., and Van Rossum J.J. Proc. 7th Int., Congr. Appl. Mech. vol. 2 (1948) 131
6. Filmetrics. Taking the Mystery Out of Thin-Film Measurements (2003), Filmetrics, San Diego
7. Groenveld P. Chem. Eng. Sci. 25 (1970) 1259