In situ transmission electron microscopy-investigations on the strain-induced B19′-phase in NiTi shape memory alloys structured by focused ion beam

Materials Science and Engineering: A

Volumn 438-440, Issue SPEC. ISS., 2006, Pages 513-516

  Kroger A ^a   Wernhardt, R ^a   Somsen, Ch ^a   Eggeler, G ^a   Wieck, A ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

Focused ion beam; In situ TEM straining; NiTi shape memory alloy; Strain induced martensite

Indexed keywords

DEFORMATION; ELASTICITY; ELECTROLYTIC POLISHING; ION BEAM ASSISTED DEPOSITION; MARTENSITE; MARTENSITIC TRANSFORMATIONS; POLYCRYSTALLINE MATERIALS; QUENCHING; SHAPE MEMORY EFFECT; SPUTTER DEPOSITION;

FOCUSED ION BEAM TECHNIQUE; SPARK-EROSION; STRAINING;

NICKEL ALLOYS;

DEFORMATION; ELASTICITY; ELECTROLYTIC POLISHING; ION BEAM ASSISTED DEPOSITION; MARTENSITE; MARTENSITIC TRANSFORMATIONS; NICKEL ALLOYS; POLYCRYSTALLINE MATERIALS; QUENCHING; SHAPE MEMORY EFFECT; SPUTTER DEPOSITION;

EID: 33750458014     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2006.04.119     Document Type: Article

References (5)

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