Stress-assisted two-way memory effect electrically driven in 50 at.%Ti-45 at.%Ni-5 at.%Cu alloy

Materials Science and Engineering: A

Volumn 438-440, Issue SPEC. ISS., 2006, Pages 653-656

  Gariboldi, F ^a   Besseghini, S ^b   Airoldi, G ^a  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b CNR   (Italy)

Author keywords

(Ni,Cu)Ti; Actuators; Electrical resistance; Stress assisted two way memory effect (SATWME)

Indexed keywords

DEFORMATION; ELECTRIC RESISTANCE; SHAPE MEMORY EFFECT; SHEAR STRESS; STRAIN;

COLD-WORK LEVELS; RESIDUAL STRAIN; STRESS-ASSISTED TWO-WAY MEMORY EFFECT;

TITANIUM ALLOYS;

DEFORMATION; ELECTRIC RESISTANCE; SHAPE MEMORY EFFECT; SHEAR STRESS; STRAIN; TITANIUM ALLOYS;

EID: 33750441512     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2006.02.096     Document Type: Article

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