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Volumn 60, Issue 29-30, 2006, Pages 3526-3529

Rietveld refinement of amorphous SiO2 prepared via sol-gel method

Author keywords

Rietveld refinement; Sol gel; X rays

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLIZATION; HEAT TREATMENT; QUARTZ; SILICA; SOL-GELS;

EID: 33750421410     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2006.03.044     Document Type: Article
Times cited : (157)

References (25)
  • 15
    • 0000418652 scopus 로고
    • Rietveld refinement of crystal structures using powder X-ray diffraction data
    • Modern Powder Diffraction. published. Bish D.L., and Post J.E. (Eds)
    • Post J.E., and Bish D.L. Rietveld refinement of crystal structures using powder X-ray diffraction data. published. In: Bish D.L., and Post J.E. (Eds). Modern Powder Diffraction. Reviews in Mineralogy vol. 20 (1989) 277-308
    • (1989) Reviews in Mineralogy , vol.20 , pp. 277-308
    • Post, J.E.1    Bish, D.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.