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Volumn 101 A, Issue , 1996, Pages 681-690
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Interfacial RhOx/CeO2 sites as locations for low temperature N2O dissociation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33750414582
PISSN: 01672991
EISSN: None
Source Type: Book Series
DOI: 10.1016/s0167-2991(96)80279-5 Document Type: Article |
Times cited : (22)
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References (15)
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