Microstructural characterization of nitrided Timetal 834

Journal of Microscopy

Volumn 223, Issue 3, 2006, Pages 195-199

  Moskalewicz, T ^a   Grogger, W ^b   Czyrska Filemonowicz, A ^a  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Analytical TEM; Surface layer; Titanium alloy

Indexed keywords

ALUMINUM NITRIDE; GLOW DISCHARGES; GRAIN BOUNDARIES; MICROSTRUCTURE; NITROGEN; SILICIDES; TITANIUM NITRIDE; ZIRCONIUM COMPOUNDS;

ANALYTICAL TRANSMISSION ELECTORN MICROSCOPY; CONDITION; GRAIN-BOUNDARIES; MICROSTRUCTURAL CHARACTERIZATIONS; NITRIDED; NITRIDED LAYER; SILICIDE PRECIPITATE; SUB-LAYERS; SURFACE LAYERS; TITANIUM (ALLOYS);

TITANIUM ALLOYS;

ALLOY; METAL; NITROGEN; TITANIUM; ZIRCONIUM;

CHEMICAL COMPOSITION; CONFERENCE PAPER; CRYSTAL STRUCTURE; FOIL; MICROSCOPY; NANOCRYSTAL; PHASE TRANSITION; PRIORITY JOURNAL; SOLID; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33750388721     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2006.01618.x     Document Type: Conference Paper

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