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Volumn T115, Issue , 2005, Pages 235-236
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Cs L-edge EXAFS atomic absorption background
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Author keywords
[No Author keywords available]
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Indexed keywords
EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;
PHOTOEXCITATION;
SIGNAL ANALYSIS;
XENON;
EXAFS ATOMIC ABSORPTION;
ROOM TEMPERATURE;
CESIUM COMPOUNDS;
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EID: 33750375881
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1238/Physica.Topical.115a00235 Document Type: Article |
Times cited : (7)
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References (15)
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