메뉴 건너뛰기




Volumn 50, Issue 9-10, 2006, Pages 1475-1478

Extraction of collector resistances for device characterization and compact models

Author keywords

Collector resistance; Forced Beta; Gummel poon; SiGe HBT

Indexed keywords


EID: 33750374615     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2006.07.007     Document Type: Letter
Times cited : (2)

References (16)
  • 1
    • 4444349170 scopus 로고    scopus 로고
    • T SiGe HBT by optimizing the contact configurations
    • T SiGe HBT by optimizing the contact configurations. IEEE MTT-S Digest (2004) 967-970
    • (2004) IEEE MTT-S Digest , pp. 967-970
    • Hsieh, M.W.1
  • 2
    • 0035162804 scopus 로고    scopus 로고
    • A scaleable model generation methodology of bipolar transistors for RFIC design
    • Lee T.Y., Schroter M., and Racanelli M. A scaleable model generation methodology of bipolar transistors for RFIC design. IEEE BCTM (2001) 171-174
    • (2001) IEEE BCTM , pp. 171-174
    • Lee, T.Y.1    Schroter, M.2    Racanelli, M.3
  • 3
    • 0002818770 scopus 로고
    • Accurate measurements of emitter and collector series resistances in transistors
    • Kulke B., and Miller S.L. Accurate measurements of emitter and collector series resistances in transistors. Proc IRE 45 (1957) 90
    • (1957) Proc IRE , vol.45 , pp. 90
    • Kulke, B.1    Miller, S.L.2
  • 4
    • 0041675191 scopus 로고
    • Measurement of emitter and collector series resistance
    • Giacolletto L.J. Measurement of emitter and collector series resistance. IEEE Trans Electron Dev 19 (1972) 692-693
    • (1972) IEEE Trans Electron Dev , vol.19 , pp. 692-693
    • Giacolletto, L.J.1
  • 5
    • 0016942514 scopus 로고
    • Error minimization in the measurement of bipolar collector and emitter resistances
    • Choma Jr. J. Error minimization in the measurement of bipolar collector and emitter resistances. IEEE J Solid-State Circuits 11 (1976) 318-322
    • (1976) IEEE J Solid-State Circuits , vol.11 , pp. 318-322
    • Choma Jr., J.1
  • 6
    • 0016940567 scopus 로고
    • Rapid determination of emitter and collector-bulk resistances
    • Huang J.S.T. Rapid determination of emitter and collector-bulk resistances. IEEE J Solid-State Circuits 11 (1976) 343-344
    • (1976) IEEE J Solid-State Circuits , vol.11 , pp. 343-344
    • Huang, J.S.T.1
  • 8
    • 0018716308 scopus 로고
    • Computer-aided determination of emitter and collector resistances of integrated bipolar transistors
    • Incecik A.Z. Computer-aided determination of emitter and collector resistances of integrated bipolar transistors. IEEE J Solid-State Circuits 14 (1979) 1108-1111
    • (1979) IEEE J Solid-State Circuits , vol.14 , pp. 1108-1111
    • Incecik, A.Z.1
  • 9
    • 0020166634 scopus 로고
    • Measurement of series collector resistance in bipolar transistors
    • Mack W.D., and Horowitz M. Measurement of series collector resistance in bipolar transistors. IEEE J Solid-State Circuits 17 (1982) 767-773
    • (1982) IEEE J Solid-State Circuits , vol.17 , pp. 767-773
    • Mack, W.D.1    Horowitz, M.2
  • 10
    • 0026107897 scopus 로고
    • Measurement of collector and emitter resistance in bipolar transistors
    • Park J.S., and Neugroschel A. Measurement of collector and emitter resistance in bipolar transistors. IEEE Trans Electron Dev 38 (1991) 365-372
    • (1991) IEEE Trans Electron Dev , vol.38 , pp. 365-372
    • Park, J.S.1    Neugroschel, A.2
  • 11
    • 0027599330 scopus 로고
    • New method for extracting collector series resistance of bipolar transistors
    • Verzellesi G., et al. New method for extracting collector series resistance of bipolar transistors. Electron Lett 29 (1993) 931-933
    • (1993) Electron Lett , vol.29 , pp. 931-933
    • Verzellesi, G.1
  • 12
    • 0028377237 scopus 로고
    • A new parameter extraction technique for small-signal equivalent circuit of polysilicon emitter bipolar transistors
    • Lee S., Ryum B.R., and Kang S.W. A new parameter extraction technique for small-signal equivalent circuit of polysilicon emitter bipolar transistors. IEEE Trans Electron Dev 41 (1994) 233-238
    • (1994) IEEE Trans Electron Dev , vol.41 , pp. 233-238
    • Lee, S.1    Ryum, B.R.2    Kang, S.W.3
  • 13
    • 0014780722 scopus 로고
    • An integral charge control model of bipolar transistors
    • Gummel H.K., and Poon H.C. An integral charge control model of bipolar transistors. J Bell Syst Tech 49 (1970) 827-852
    • (1970) J Bell Syst Tech , vol.49 , pp. 827-852
    • Gummel, H.K.1    Poon, H.C.2
  • 14
    • 0036441805 scopus 로고    scopus 로고
    • State of art RF/Analog foundry technology
    • Lin J.C.H., et al. State of art RF/Analog foundry technology. IEEE BCTM (2002) 73-79
    • (2002) IEEE BCTM , pp. 73-79
    • Lin, J.C.H.1
  • 15
    • 33750359617 scopus 로고    scopus 로고
    • Paasschens JCJ, Kloosterman WJ. The Mextram bipolar transistor model - level 504. Nat. lab. Unclassified Report. Koninklijke Philips Electronics N.V. 2001.
  • 16
    • 33750381201 scopus 로고    scopus 로고
    • Bipolar model standardization. Compact Model Council Meeting. 1999;6.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.