Probing pairing symmetry of Sm1.85Ce0.15CuO4 via highly-sensitive voltage measurements: Evidence for strong impurity scattering

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 359, Issue 6, 2006, Pages 696-699

  Lanfredi, A J C ^a   Sergeenkov, S ^a,b   Araujo Moreira, F M ^a  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^b JOINT INSTITUTE FOR NUCLEAR RESEARCH   (Russian Federation)

Author keywords

Electron doped superconductors; Pairing symmetry; Penetration depth

Indexed keywords

CERIUM COMPOUNDS; INDUCTANCE; PENETRATION DEPTH (SUPERCONDUCTIVITY); SAMARIUM COMPOUNDS; SUPERCONDUCTING MATERIALS; TEMPERATURE;

D-WAVE PAIRING; ELECTRON-DOPED; IMPURITY SCATTERING; LOW TEMPERATURE BEHAVIOR; MAGNETIC PENETRATION DEPTH; MUTUAL INDUCTANCE; PAIRING SYMMETRIES; TEMPERATURE PROFILES;

COPPER COMPOUNDS;

EID: 33750371581     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2006.07.010     Document Type: Article

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