Double-shot depth-resolved displacement field measurement using phase-contrast spectral optical coherence tomography

Optics Express

Volumn 14, Issue 21, 2006, Pages 9643-9655

  De la Torre Ibarra, Manuel H ^a   Ruiz, Pablo D ^b   Huntley, Jonathan M ^b  

^a CENTRO de INVESTIGACIONES en OPTICA AC   (United States)

^b LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; INTERFEROMETRY; SENSITIVITY ANALYSIS; STRAIN; TOMOGRAPHY;

GLASS SHEETS; OPTICAL COHERENCE TOMOGRAPHY; STRAIN MAPPING; SUB-SURFACE DISPLACEMENT;

OPTICAL VARIABLES MEASUREMENT;

EID: 33750350270     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.009643     Document Type: Article

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