-
1
-
-
0036693343
-
Reduction of diffraction effect of UV exposure on SU-8 negative thick photo resist by Air- gap elimination
-
Chuang YF, Tseng FG, Lin WK (2002) Reduction of diffraction effect of UV exposure on SU-8 negative thick photo resist by Air- gap elimination. Microsyst Technol 8:308-313
-
(2002)
Microsyst Technol
, vol.8
, pp. 308-313
-
-
Chuang, Y.F.1
Tseng, F.G.2
Lin, W.K.3
-
2
-
-
11744310151
-
Recent developments in deep X-ray lithography
-
Ehrfeld W, Schmidt A (1998) Recent developments in deep X-ray lithography. J Vac Sci Technol B 16(6):3526-3534
-
(1998)
J Vac Sci Technol B
, vol.16
, Issue.6
, pp. 3526-3534
-
-
Ehrfeld, W.1
Schmidt, A.2
-
4
-
-
0141716570
-
Longterm productivity mechanisms of the semiconductor industry
-
Electrochemical Society
-
Goodall R, Fandel, Allan A, Landler P, Huff H (2002) Longterm productivity mechanisms of the semiconductor industry. In: Semiconductor silicon 2002 proceedings, 9th edn. Electrochemical Society
-
(2002)
Semiconductor Silicon 2002 Proceedings, 9th Edn.
-
-
Goodall, R.1
Fandel2
Allan, A.3
Landler, P.4
Huff, H.5
-
5
-
-
0035768033
-
Laser micromachining for MEMS devices
-
Gower MC (2001) Laser micromachining for MEMS devices. Proc SPIE 4559:53-59
-
(2001)
Proc SPIE
, vol.4559
, pp. 53-59
-
-
Gower, M.C.1
-
6
-
-
3142666016
-
Fundamental limitations of LIGA X-ray lithography: Sidewall offset, slope and minimum feature size
-
Griffiths SK (2004) Fundamental limitations of LIGA X-ray lithography: sidewall offset, slope and minimum feature size. J Micromech Microeng 14(7):999-1011
-
(2004)
J Micromech Microeng
, vol.14
, Issue.7
, pp. 999-1011
-
-
Griffiths, S.K.1
-
7
-
-
0037683086
-
Challenges, developments and applications of silicon deep reactive ion etching
-
Laermer F, Urban A (2003) Challenges, developments and applications of silicon deep reactive ion etching. Microelectron Eng 67-68:349-355
-
(2003)
Microelectron Eng
, vol.67-68
, pp. 349-355
-
-
Laermer, F.1
Urban, A.2
-
9
-
-
27144553733
-
Manufacturing tolerances for UV LIGA using SU-8 resist
-
Lawes R A (2005) Manufacturing tolerances for UV LIGA using SU-8 Resist. J Micromech Microeng 15:2198-2203
-
(2005)
J Micromech Microeng
, vol.15
, pp. 2198-2203
-
-
Lawes, R.A.1
-
11
-
-
0038798179
-
Micromachining applications of high resolution ultra-thick resist
-
Lee K et al (1995) Micromachining applications of high resolution ultra-thick resist. J Vac Sci Tech B 13(6):3012-3016
-
(1995)
J Vac Sci Tech B
, vol.13
, Issue.6
, pp. 3012-3016
-
-
Lee, K.1
-
13
-
-
4344605121
-
Excimer laser patterning of thick and thin films for high density packaging
-
Rumsby P, Harvey E, Thomas D, Rizvi N (1997) Excimer laser patterning of thick and thin films for high density packaging. Proc SPIE 3184:176-185
-
(1997)
Proc SPIE
, vol.3184
, pp. 176-185
-
-
Rumsby, P.1
Harvey, E.2
Thomas, D.3
Rizvi, N.4
-
14
-
-
0032136370
-
Wafer-to-wafer bonding for microstructure formation
-
Schmidt MA (1998) Wafer-to-wafer bonding for microstructure formation. Proc IEEE 86(8):575-1585
-
(1998)
Proc IEEE
, vol.86
, Issue.8
, pp. 575-1585
-
-
Schmidt, M.A.1
-
15
-
-
10644278139
-
Effect of exposure dose on the replication fidelity and profile of very high aspect ratio microchannels in SU-8
-
Zhang J, Chan Park MB, Connor SR (2004) Effect of exposure dose on the replication fidelity and profile of very high aspect ratio microchannels in SU-8. Lab Chip 4:646-653
-
(2004)
Lab Chip
, vol.4
, pp. 646-653
-
-
Zhang, J.1
Chan Park, M.B.2
Connor, S.R.3
|