Atomic force microscope-force mapping and profiling on a sub 100-Å scale

Journal of Applied Physics

Volumn 61, Issue 10, 1987, Pages 4723-4729

  Martin, Y ^a   Williams, C C ^a   Wickramasinghe, H K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

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EID: 33750306098     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.338807     Document Type: Article

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