Digital image correlation combined with electronic speckle pattern interferometery for 3D deformation measurement in small samples

Proceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006

Volumn 3, Issue , 2006, Pages 1396-1402

  Reu, Phillip L ^a   Hansche, Bruce D ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Digital Image Correlation (DIC); Electronic Speckle Pattern Interferometry (ESPI); LIGA; MEMS

Indexed keywords

DIGITAL IMAGE CORRELATION (DIC); ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI); LIGA; MICROELECTROMECHANICAL SYSTEMS (MEMS);

DEFORMATION; MICROELECTROMECHANICAL DEVICES; OPTOELECTRONIC DEVICES; PATTERN RECOGNITION; SPECKLE;

INTERFEROMETERS;

EID: 33750298141     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

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