SCOPUS 정보 검색 플랫폼

Volumn 60, Issue 29-30, 2006, Pages 3871-3873

The structural and electrical property of CuCr1 - xNixO2 delafossite compounds

(4) Zheng, S Y a Jiang, G S a Su, J R a Zhu, C F a

a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

Author keywords

Electrical property; Raman spectroscopy; Seekbeck coefficient; Transparent conducting oxides; Transport mechanism; X ray photoelectron spectroscopy

Indexed keywords

DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; NICKEL COMPOUNDS; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; SEEBECK EFFECT; TRANSPORT PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

DELAFOSSITE COMPOUNDS; ROOM TEMPERATURE; SEEKBECK COEFFICIENTS; TRANSPARENT CONDUCTING OXIDES (TCO);

COPPER COMPOUNDS;

EID: 33750295490 PISSN: 0167577X EISSN: None Source Type: Journal
DOI: 10.1016/j.matlet.2006.03.132 Document Type: Article

Times cited : (64)

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