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Volumn 3, Issue , 2006, Pages 1289-1299

Full-field optical measurement for material parameter identification with inverse methods

Author keywords

Digital image correlation; FEA; Full field measurement; Inverse method

Indexed keywords

COMPUTER SIMULATION; FINITE ELEMENT METHOD; IDENTIFICATION (CONTROL SYSTEMS); INVERSE PROBLEMS; MATHEMATICAL MODELS; STANDARDIZATION;

EID: 33750284957     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (5)
  • 2
    • 33750319739 scopus 로고    scopus 로고
    • Material identification using mixed numerical experimental methods
    • Sol H., Oomens C.W.J., Material identification using mixed numerical experimental methods. Kluwer Academic Publishers, pp 1-9, 1997
    • (1997) Kluwer Academic Publishers , pp. 1-9
    • Sol, H.1    Oomens, C.W.J.2
  • 3
    • 0001627714 scopus 로고    scopus 로고
    • A stereoscopic digital speckle photography system for 3-D displacement field measurements
    • Synnergren P., Sjôdagk M., A stereoscopic digital speckle photography system for 3-D displacement field measurements. Optics and Lasers in Engineeing, 31, pp 425-433, 1999
    • (1999) Optics and Lasers in Engineeing , vol.31 , pp. 425-433
    • Synnergren, P.1    Sjôdagk, M.2
  • 4
    • 2342581618 scopus 로고    scopus 로고
    • Characterisation of materials subjected to large strains by inverse modeling based on in-plane displacement fields
    • Kajberg J., Lindkvist G., Characterisation of materials subjected to large strains by inverse modeling based on in-plane displacement fields. International Journal of Solids and Structures, 41, pp 3439-3459, 1999
    • (1999) International Journal of Solids and Structures , vol.41 , pp. 3439-3459
    • Kajberg, J.1    Lindkvist, G.2
  • 5
    • 0000673576 scopus 로고    scopus 로고
    • Speckle interferometry: Three-dimensional field measurement with a single interferogram
    • M., 1 October
    • Fricke-Begemann T., Burke J., Speckle interferometry: three-dimensional field measurement with a single interferogram. M., Applied Optics 40(28), pp 5011-5022, 1 October 2001
    • (2001) Applied Optics , vol.40 , Issue.28 , pp. 5011-5022
    • Fricke-Begemann, T.1    Burke, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.