Scanning electron microscopy and transmission electron microscopy in situ studies of grain boundary migration in cold-deformed aluminium bicrystals

Journal of Microscopy

Volumn 223, Issue 3, 2006, Pages 264-267

  Paul, H ^a,b   Driver, J H ^c   Morgiel, J ^a   Lens, A ^c   Bydalek A ^b   Bijak, M ^a  

^a INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Poland)

^b UNIVERSITY OF ZIELONA GÓRA   (Poland)

^c CENTRE SMS   (France)

Author keywords

Aluminium bicrystals; Orientation imaging maps; Recrystallization; Texture

Indexed keywords

ALUMINUM; BICRYSTALS; GRAIN BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; TEXTURES;

ALUMINUM BICRYSTALS; CHANNEL DIE; GRAIN BOUNDARY MIGRATIONS; IN-CHANNELS; IN-SITU STUDY; ORIENTATION IMAGING; ORIENTATION IMAGING MAP; PURE ALUMINIUM; PURE ALUMINUM; RECRYSTALLISATION;

RECRYSTALLIZATION (METALLURGY);

ALUMINUM;

CONFERENCE PAPER; CRYSTAL STRUCTURE; CRYSTALLIZATION; CRYSTALLOGRAPHY; GRAIN; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33750272215     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2006.01641.x     Document Type: Conference Paper

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