Thermal conductivity contrast measurement of fused silica exposed to low-energy femtosecond laser pulses

Applied Physics Letters

Volumn 89, Issue 16, 2006, Pages

  Bellouard, Yves ^a   Dugan, Mark ^b   Said, Ali A ^b   Bado, Philippe ^b  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b TRANSLUME INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTRAST MEASUREMENT; ETCHING SELECTIVITY; FEMTOSECOND LASER PULSES; THERMAL CONDUCTIVITY MAPPING;

ELECTRON ENERGY LEVELS; ETCHING; FUSED SILICA; HYDROFLUORIC ACID; REFRACTIVE INDEX; THERMAL CONDUCTIVITY;

LASER PULSES;

EID: 33750187018     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2363957     Document Type: Article

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