Contact angle analysis on polymethylmethacrylate and commercial wax by using an environmental scanning electron microscope

Scanning

Volumn 28, Issue 5, 2006, Pages 267-273

  Brugnara, Marco ^a   Della Volpe, Claudio ^a   Siboni, Stefano ^a   Zeni, Dario ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

Contact angle; Environmental scanning electron microscope; Tilted spherical cap

Indexed keywords

APPROXIMATION THEORY; CONTACT ANGLE; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY;

AXISYMMETRIC DROP SHAPE ANALYSIS (ADSA); ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE (ESEM); OBSERVATION ANGLES; TILTED SPHERICAL CAPS;

POLYMETHYL METHACRYLATES;

POLY(METHYL METHACRYLATE); WAX;

ALGORITHM; ARTICLE; CALCULATION; CONTACT ANGLE; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE; MATERIALS; MATERIALS TESTING; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; MICROANALYSIS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRON MICROSCOPY; SIMULATION; SURFACE PROPERTY; TEMPERATURE; VAPOR PRESSURE; WETTABILITY;

CONTACT ANGLE; MATHEMATICAL MODELS; POLYMETHYL METHACRYLATE; SCANNING ELECTRON MICROSCOPY;

EID: 33750151292     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950280504     Document Type: Article

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