Bayesian neural networks for nonlinear multivariate manufacturing process monitoring

Proceedings of the International Joint Conference on Neural Networks

Volumn 4, Issue , 2005, Pages 2308-2312

  Zhang, Feng ^a  

^a FAIRCHILD SEMICONDUCTOR   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAYESIAN NEURAL NETWORKS; MULTIVARIATE MEASUREMENT VARIABLES; OVERFITTING PROBLEMS; PARAMETER LEARNING;

CONDITION MONITORING; CORRELATION METHODS; FEATURE EXTRACTION; MULTIVARIABLE CONTROL SYSTEMS; PRINCIPAL COMPONENT ANALYSIS; PROCESS CONTROL;

NEURAL NETWORKS;

EID: 33750132398     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IJCNN.2005.1556261     Document Type: Conference Paper

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