Tailoring of black-box testing methods

Proceedings of the Australian Software Engineering Conference, ASWEC

Volumn 2006, Issue , 2006, Pages 292-299

  Murnane, Tafline ^a   Reed, Karl ^a   Hall, Richard ^a  

^a LA TROBE UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ENGINEERS; INFORMATION TECHNOLOGY; MATHEMATICAL MODELS; SOFTWARE ENGINEERING;

AD HOC CUSTOMIZATION; BLACK BOX TESTING;

COMPUTER TESTING;

EID: 33750114356     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASWEC.2006.49     Document Type: Conference Paper

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