Photothermal investigation of Ti-Cu-N and Ti-Ni-N PVD films

CIRP Annals - Manufacturing Technology

Volumn 55, Issue 1, 2006, Pages 585-588

  Prekel, H ^a   Klopfstein, M J ^b   Giesselbach, M ^c   Patzelt, S ^a   Ghisleni, R ^b   Lucca, D A ^b   Goch, G ^a   Stock, H R ^c  

^a UNIVERSITY OF BREMEN   (Germany)

^b Oklahoma State University   (United States)

^c STIFTUNG INSTITUT FÜR WERKSTOFFTECHNIK   (Germany)

Author keywords

Coating; Photothermal radiometry; Physical Vapour Deposition (PVD)

Indexed keywords

HEAT TREATMENT; INTERMETALLICS; MOLDING; OPTICAL DEVICES; RADIOMETRY; THIN FILMS; TITANIUM;

PHOTOTHERMAL INVESTIGATION; PHOTOTHERMAL RADIOMETRY; PROCESS PARAMETERS;

PHYSICAL VAPOR DEPOSITION;

EID: 33750079299     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)60488-0     Document Type: Article

References (11)

1. Paul, E., Evans, C.J., Mangamelli, A. McGlauflin, M.L., Polvani, R.S., 1996, Chemical aspects of tool wear in single point diamond turning, Precision Engineering, 18:4-19.
2. Vennemann, A., Stock, H.-R., Kohlscheen, J., Vorgel, E., Mayr, P., 2003, New diamond turnable coatings of ternary systems for ultraprecision cutting, Surface and Coatings Technology, 174-175:973-978.
3. Rosencwaig, A., 1980, Photoacoustics and Photo-acoustic Spectroscopy. Chemical Analysis, 57, John Wiley & Sons, New York, Chichester/Brisbane/ Toronto.
4. Goch, G., Schmitz, B., Reick, M., 1993, Photothermal Sensing Techniques for Measuring Material Properties and Near-Surface Defects, Annals of the CIRP, 42/1:623-626.
5. Goch, G., Prekel, H., Patzelt, S., Ströbel, G., Lucca, D.A., Stock, H.-R., Mehner, A., 2004, Non-Destructive and Non-Contact Determination of Layer Thickness and Thermal Properties of PVD and Sol-Gel Layers by Photothermal Methods, Annals of the CIRP, 53/1:471-474.
6. Goch, G., Schmitz, B., Karpuschewski, B., Geerkens, J., Reigl, M., Sprongl, P., Ritter, R., 1999, Review of Non-Destructive Methods for the Assessment of Surface Integrity: A Survey of New Measuring Methods for Coatings, Layered Structures and Processed Surfaces, Precision Engineering, 23:9-33.
7. Oliver, W.C., Pharr, G.M., 1992, An Improved Technique for Determining Hardness and Elastic Modulus Using Load and Displacement Sensing Indentation Experiments, J. Mater. Res., 7:1564-1583.
8. Ciossek, A., Patzelt, S., Lehmann, P., Goch, G., 2000, In-process characterization of surface topography changes during nitration, SPIE, Optical Science and Technology, Scattering and Surface Roughness III, San Diego, 4100:182-189.
9. Yoshimura, T., Kazuo, K., Nakagawa, K., 1990, Surface roughness dependence of the intensity correlation function under speckle pattern illumination, Journal Optical Society of America, A 7:2254-2259.
10. Patzelt, S., Goch, G., 2004, Scattered light techniques for surface characterization of optical components, XI. Internationales Oberflächen- kolloquium, Chemnitz, Shaker Verlag, Aachen, 1:214-22.
11. Tsui, T.Y., Pharr, G.M., Oliver, W.C., Bhatia, C.S., White, R.L., Anders, S., Anders, A., Brown, I.G., 1995, Nanoindentation and Nanoscratching of Hard Carbon Coatings for Magnetic Disks, Mat. Res. Soc. Symp. Proc., 383:447-452.