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Volumn 97, Issue 9, 2006, Pages 1220-1223

The deformation behaviour of electrodeposited nanocrystalline Ni in an atomic force microscope with a newly developed in situ bending machine

Author keywords

Atomic force microscopy; Fatigue; Grain boundary sliding; In situ bending; Nanocrystalh'ne Ni

Indexed keywords

ATOMIC FORCE MICROSCOPY; BENDING MACHINES; CRACK PROPAGATION; DEFORMATION; ELECTRODEPOSITION; FATIGUE OF MATERIALS; NICKEL COMPOUNDS; SINGLE CRYSTALS;

EID: 33750072627     PISSN: 18625282     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.101360     Document Type: Article
Times cited : (10)

References (10)
  • 9
    • 33750077446 scopus 로고    scopus 로고
    • Digital Instruments Inc., California, USA
    • Nano Scope: Command Reference Manual, Version 4.20, Digital Instruments Inc., California, USA, 1996.
    • (1996) Command Reference Manual, Version 4.20


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.