Comparison of silicon nanocrystals size determination by Raman scattering and transmission electron microscopy measurements

Optical Materials

Volumn 29, Issue 2-3, 2006, Pages 279-286

  Blondeau, Jean Philippe ^a   Andreazza, Caroline ^b   Simon, Patrick ^c   Catan, Francis ^a   Allam, Lévi ^a  

^a Hospital of Chartres   (France)

^b CRMD CNRS Université   (France)

^c Centre National de la Recherche Scientifique   (France)

Author keywords

DDA; DLA; Fractals; Nanocrystalline silicon; Raman scattering; TEM measurements

Indexed keywords

CRYSTALLINE MATERIALS; DIFFUSION; RAMAN SCATTERING; SILICON; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

DEPOSITION DIFFUSION AGGREGATES (DDA); DIFFUSION LIMITED AGGREGATES (DLA); NANOCRYSTALLINE SILICON;

NANOSTRUCTURED MATERIALS;

EID: 33750017318     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2005.09.073     Document Type: Article

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