Work function analysis of GaN-based lateral polarity structures by Auger electron energy measurements

Journal of Applied Physics

Volumn 100, Issue 7, 2006, Pages

  Niebelschutz M ^a   Ecke, G ^a   Cimalla, V ^a   Tonisch, K ^a   Ambacher, O ^a  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON ENERGY; LATERAL POLARITY HETEROSTRUCTURE (LPH); SURFACE BAND BENDING;

AUGER ELECTRON SPECTROSCOPY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; FERMI LEVEL; FUNCTION EVALUATION; GALLIUM NITRIDE;

HETEROJUNCTIONS;

EID: 33749996438     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2353785     Document Type: Article

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