Dilatometric size effect in thin C60 films

Low Temperature Physics

Volumn 23, Issue 8, 1997, Pages 642-643

  Pugachev, A T ^a   Churakova, N P ^a   Gorbenko, N I ^a  

^a NATIONAL TECHNICAL UNIVERSITY   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER; C60 FILMS; LINEAR THERMAL EXPANSIONS; MONOCRYSTALLINE; SIZE EFFECTS; TEMPERATURE RANGE; TRANSMISSION HIGH ENERGY ELECTRON DIFFRACTION;

THERMAL EXPANSION;

EID: 33749986070     PISSN: 1063777X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.593442     Document Type: Article

References (11)

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