Characterization and properties of Si3N4p/Si3N4 radome material prepared by chemical vapor infiltration

Wuji Cailiao Xuebao/Journal of Inorganic Materials

Volumn 21, Issue 4, 2006, Pages 979-985

  Liu, Yi ^a   Liu, Yong Sheng ^a   Zhang, Li Tong ^a   Cheng, Lai Fei ^a   Xu, Yong Dong ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

Chemical vapor infiltration (CVI); Dielectric constant; Flexural strength; Si3N4p Si3N4 radome material

Indexed keywords

CHEMICAL VAPOR INFILTRATION (CVI); DIELECTRIC CONSTANT; FLEXURAL STRENGTH; RADOME MATERIAL;

AMORPHOUS MATERIALS; BENDING STRENGTH; BONDING; CHARACTERIZATION; CHEMICAL ELEMENTS; HEAT TREATMENT; INFILTRATION; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

RADOMES;

EID: 33749848729     PISSN: 1000324X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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