Detection of irregularities in regular dot patterns

Proceedings of the 9th IAPR Conference on Machine Vision Applications, MVA 2005

Volumn , Issue , 2005, Pages 380-383

  Sadovnikov, A ^a   Vartiainen, J ^a   Kamarainen, J K ^a   Lensu, L ^a   Kalviainen H ^a  

^a LAPPEENRANTA UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

DOT PATTERNS; IMAGE ELEMENTS; PRINTING INDUSTRY;

COMPUTER VISION;

EID: 33749680737     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. N.W. Ashcroft and N. D.Mermin. Solid Stace Physics. Thomson Learning, Inc., 1976 .
2. C . H. Chan and G.K.H. Pang. Fabric defect detection by Fourier analysis. IEEE Trans. on Industry Applications, 36 (5 ):1267 - 1276, 2000.
3. R . C . Gonzalez and R . E. Woods. Digital Image Processing. Prentice-Hall, Inc., 2002.
4. Robert M. Haralick. Statistical and structural approaches to texture. Proc. of the IEEE, 67 (5 ):786 - 804, 1979.
5. W.A. Heeschen and D.A. Smith. Robust digital image analysis method for counting missing dots in gravure printing. In Proc. Int. Printing & Graphic Arts Conference, pages 29-35, Atlanta, GA, U SA, 2000.
6. A. Langinmaa. An image analysis based method to evaluate gravure paper quality. In Proc. 11th IAPR Int. Conf. on Computer Vision and Applications, volume 1, pages 777 - 780, 1992.
7. J.-E. Levlin and L. Söderbjelm. Pulp and Paper Testing. Papermaking Science and Technology. FapetOy, 1999.
8. E. Oja and T. Kohonen. The subspace learning algorithm as a formalism for pattern recognition and neural networks. IEEE Int. Conf. on Neural Networks, 1:277- 284, 1988.
9. Albert Sadovnikov. Automated Heliotest inspection using machine vision. Master's thesis, Lappeenranta U niversity of Technology, 2003.