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Volumn 119, Issue 1-4, 2006, Pages 474-478

A comparison of quartz OSL and isothermal TL measurements on Chinese loess

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE;

EID: 33749677834     PISSN: 01448420     EISSN: None     Source Type: Journal    
DOI: 10.1093/rpd/nci518     Document Type: Article
Times cited : (30)

References (5)
  • 4
    • 0033895553 scopus 로고    scopus 로고
    • Luminescence dating of quartz using an improved single-aliquot regenerative-dose protocol
    • Murray, A. S. and Wintle, A. G. Luminescence dating of quartz using an improved single-aliquot regenerative-dose protocol. Radiat. Meas. 32, 57-73 (2000).
    • (2000) Radiat. Meas. , vol.32 , pp. 57-73
    • Murray, A.S.1    Wintle, A.G.2
  • 5
    • 0028590720 scopus 로고
    • Luminescence dating of archaeological materials using a new technique based on single aliquot measurements
    • Mejdahl, V. and Bøtter-Jensen, L. Luminescence dating of archaeological materials using a new technique based on single aliquot measurements. Quat. Sci. Rev. 7, 551-554 (1994).
    • (1994) Quat. Sci. Rev. , vol.7 , pp. 551-554
    • Mejdahl, V.1    Bøtter-Jensen, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.