Defect analysis of carbon nanotubes

AIP Conference Proceedings

Volumn 786, Issue , 2005, Pages 215-219

  Dewald, James L ^a   Talla, Jamal ^a   Pietrass, Tanja ^b   Curran, Seamus A ^a  

^a NEW MEXICO STATE UNIVERSITY   (United States)

^b NEW MEXICO INSTITUTE OF MINING AND TECHNOLOGY   (United States)

Author keywords

Defects; Nanotube; Raman

Indexed keywords

EID: 33749667205     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2103855     Document Type: Conference Paper

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