Subaperture stitching interferometry for testing mild aspheres

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6293, Issue , 2006, Pages

  Murphy, Paul ^a   Fleig, Jon ^a   Forbes, Greg ^a   Miladinovic, Dragisha ^a   DeVries, Gary ^a   O'Donohue, Stephen ^a  

^a QED TECHNOLOGIES   (United States)

Author keywords

Asphere; Interferometry; Metrology; SSI ; Subaperture stitching

Indexed keywords

ANNULAR ZONES; ASPHERE COMPENSATION; ASPHERES; ASPHERIC DEPARTURE; SUBAPERTURE STITCHING;

ABERRATIONS; ASPHERICS; COMPUTER SOFTWARE; ERROR CORRECTION; LIGHT INTERFERENCE; MEASUREMENT THEORY;

INTERFEROMETRY;

EID: 33749656225     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.680473     Document Type: Conference Paper

References (8)

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8. S. O'Donohue, G. DeVries, P. Murphy, G. Forbes, and P. Dumas, "New methods for calibrating systematic errors in interferometric measurements," Optical Manufacturing and Testing VI, H. Philip Stahl, Ed., Proc. SPIE 5869, SPIE, Bellingham, WA, 2003.