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Volumn 119, Issue 1-4, 2006, Pages 470-473
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Thermal pre-treatment in the OSL dating of quartz: Is it necessary?
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Author keywords
[No Author keywords available]
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Indexed keywords
SILICON DIOXIDE;
ACCURACY;
AGE DETERMINATION;
ARTICLE;
AUSTRALIA;
HEATING;
MATHEMATICAL ANALYSIS;
OPTICALLY STIMULATED LUMINESCENCE;
PORTABLE EQUIPMENT;
RADIATION DETECTION;
RADIATION DOSE;
RADIATION MEASUREMENT;
RADIATION RESPONSE;
RUSSIAN FEDERATION;
SEDIMENT;
SIGNAL PROCESSING;
STANDARD;
TEMPERATURE DEPENDENCE;
THERMOLUMINESCENCE DOSIMETRY;
THERMOSTABILITY;
GEOLOGIC SEDIMENTS;
HALF-LIFE;
HEAT;
HOT TEMPERATURE;
MATERIALS TESTING;
QUARTZ;
REPRODUCIBILITY OF RESULTS;
SENSITIVITY AND SPECIFICITY;
THERMOLUMINESCENT DOSIMETRY;
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EID: 33749651675
PISSN: 01448420
EISSN: None
Source Type: Journal
DOI: 10.1093/rpd/nci501 Document Type: Article |
Times cited : (6)
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References (10)
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