Enhancement of flying probe tester systems with automated optical inspection

Proceedings of the Annual Southeastern Symposium on System Theory

Volumn 2006, Issue , 2006, Pages 367-371

  Radev, Penio ^a   Shirvaikar, Mukul ^a  

^a UNIVERSITY OF TEXAS AT TYLER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INSPECTION TIMES; LIGHTING VARIATION; OCCLUSION; UNPOPULATED SLOTS;

DATA REDUCTION; FACE RECOGNITION; LIGHTNING; PRINTED CIRCUIT BOARDS; SYSTEMS ANALYSIS;

IMAGE ENHANCEMENT;

EID: 33749646133     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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4. E. Bayro-Corrochano, "Review of Automated Inspection 1983 to 1993 Part I: Conventional approaches", SPIE-Intelligent Robot and Computer Vision XII, vol. 2055, pp. 128-158, 1993.
5. M. Turk and A. Pentland, "Eigenfaces for Recognition", Journal of Cognitive Neuroscience, vol.3, No. 1, pp.71-86, 1991.
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7. N.Kim, J.Pyun, K.Choi, B.Choi, and S. Ko, "Real Time Inspection System for Printed Circuit Boards", Proc. IEEE Intl. Symposium on Industrial Electronics, ISIE 2001, vol.1, pp. 166-170, 12-16 June 2001.